The Inspectis Microscope 90º Side‑View BGA Standard Probe Tip (BGA‑006) is a precision optical probe accessory designed to pair with the Inspectis 90º Side‑View BGA Standard Lens for detailed side‑view inspection of hidden solder joints on FipChip, BGA, µBGA, CGA, CSP, SMD and similar surface‑mounted components. It enables high‑resolution imaging of features that are difficult to see with standard top‑down optics. 

This probe tip is ideal as a replacement or additional accessory for side‑view BGA inspection systems, giving technicians and quality control professionals flexible optical access in demanding electronics inspection workflows.

Specifications

• Part Number / SKU: BGA‑006 (Standard) and BGA‑006‑XM (Extended Magnification)

• Optical Probe Tip Thickness: ~1.8 mm 

• Optical Probe Tip Width: ~6.6 mm

• Footprint of Probe Tip: ~0.85 × 6.6 mm 

• Required Free Working Area: ~1.0 mm 

• Compatibility: Designed to work with the Inspectis 90º Side‑View BGA Standard Lens (and compatible BGA systems)

• Manufactured: Sweden 

• Warranty: 2‑year limited manufacturer warranty

• Return Policy: This item is non‑returnable 

• Estimated Delivery: ~3–4 weeks

Features & Benefits

• Designed for Side‑View Inspection — Specifically engineered to pair with the 90º Side‑View BGA Lens for detailed imaging of hidden solder joints and under‑component features. 

• Standard & XM Options — Available in standard and extended magnification versions to suit different levels of optical detail.

• Slim Optical Footprint — Slim probe tip profile enables access to tight stand‑off areas around components.

• Industrial‑Grade Design — Manufactured in Sweden to professional standards and built for repetitive inspection work.

• Essential BGA Accessory — Ideal as a replacement or backup probe for side‑view inspection and quality control routines.